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SampleName,ImagePath,Width,Height,Category,Goal,BaselinePipeline,ValidationMode,ExpectedMetricName,ExpectedMetricMinimum,ExpectedMetricMaximum,ExpectedOutcome,ExpectedError,ExpectedFailedStep,Notes,ReferenceImagePath,PairGroup,PairRole
Product_Battery_TabGap_Good,docs\samples\public\product\Battery_TabGap_OK.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Measure the spacing between two battery tab edges.",docs\samples\public\product\Product_Battery_TabGap_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.25,,,,"Public-safe secondary-battery tab gap benchmark. The line tool should measure a normal spacing band.",,Battery_TabGap,Good
Product_Battery_TabGap_Narrow_Bad,docs\samples\public\product\Battery_TabGap_Narrow_NG.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Reject a battery tab gap that is too narrow.",docs\samples\public\product\Product_Battery_TabGap_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,QualityNG,,01 Battery Tab Gap Distance,"Controlled NG benchmark for battery tab spacing. The same LineDistance pipeline should fail because the measured gap is below the normal band.",,Battery_TabGap,Bad
Product_Battery_WeldSpatter_Good,docs\samples\public\product\Battery_WeldSpatter_OK.png,572,420,Product Synthetic / Secondary Battery / Blob,"Count bright weld-spatter candidates near a battery weld.",docs\samples\public\product\Product_Battery_WeldSpatter_Blob.pipeline.xml,Required,ResultCount,3,8,,,,"Public-safe secondary-battery weld benchmark. A few bright candidates remain acceptable.",,Battery_WeldSpatter,Good
Product_Battery_WeldSpatter_Heavy_Bad,docs\samples\public\product\Battery_WeldSpatter_Heavy_NG.png,572,420,Product Synthetic / Secondary Battery / Blob,"Reject a battery weld with too many bright spatter candidates.",docs\samples\public\product\Product_Battery_WeldSpatter_Blob.pipeline.xml,ExpectedFailure,ResultCount,10,16,,,,"Controlled NG benchmark for battery weld spatter count.",,Battery_WeldSpatter,Bad
Product_Battery_WeldOverburn_Good,docs\samples\public\product\Battery_WeldOverburn_OK.png,572,420,Product Synthetic / Secondary Battery / Blob,"Count bright overburn hot-spot candidates around a battery tab weld.",docs\samples\public\product\Product_Battery_WeldOverburn_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery weld overburn benchmark. One small hot spot remains inside the review band.",,Battery_WeldOverburn,Good
Product_Battery_WeldOverburn_Many_Bad,docs\samples\public\product\Battery_WeldOverburn_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Blob,"Reject a battery tab weld with several overburn hot spots.",docs\samples\public\product\Product_Battery_WeldOverburn_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for battery weld-overburn count.",,Battery_WeldOverburn,Bad
Product_Battery_TabTear_Good,docs\samples\public\product\Battery_TabTear_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count torn-tab edge candidates on a battery tab row.",docs\samples\public\product\Product_Battery_TabTear_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery tab-tear benchmark. One small tear candidate remains inside the review band.",,Battery_TabTear,Good
Product_Battery_TabTear_Many_Bad,docs\samples\public\product\Battery_TabTear_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery tab row with several torn-tab candidates.",docs\samples\public\product\Product_Battery_TabTear_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for battery tab-tear count.",,Battery_TabTear,Bad
Product_Battery_TabPlatingPeel_Good,docs\samples\public\product\Battery_TabPlatingPeel_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count tab plating peel candidates on a battery tab row.",docs\samples\public\product\Product_Battery_TabPlatingPeel_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery tab-plating peel benchmark. One small peel candidate remains inside the review band.",,Battery_TabPlatingPeel,Good
Product_Battery_TabPlatingPeel_Many_Bad,docs\samples\public\product\Battery_TabPlatingPeel_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery tab row with several plating-peel candidates.",docs\samples\public\product\Product_Battery_TabPlatingPeel_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for battery tab-plating peel count.",,Battery_TabPlatingPeel,Bad
Product_Battery_ElectrolyteStain_Good,docs\samples\public\product\Battery_ElectrolyteStain_OK.png,572,420,Product Synthetic / Secondary Battery / Mean,"Measure electrolyte-stain brightness drift on a battery cell inspection region.",docs\samples\public\product\Product_Battery_ElectrolyteStain_Mean.pipeline.xml,Required,MeanValueAvg,70,96,,,,"Public-safe secondary-battery electrolyte-stain benchmark. A faint stain remains inside the normal mean-brightness band.",,Battery_ElectrolyteStain,Good
Product_Battery_ElectrolyteStain_Heavy_Bad,docs\samples\public\product\Battery_ElectrolyteStain_Heavy_NG.png,572,420,Product Synthetic / Secondary Battery / Mean,"Reject a battery cell with heavy electrolyte-stain brightness drift.",docs\samples\public\product\Product_Battery_ElectrolyteStain_Mean.pipeline.xml,ExpectedFailure,MeanValueAvg,106,150,,,,"Controlled NG benchmark for heavy electrolyte-stain brightness drift.",,Battery_ElectrolyteStain,Bad
Product_Battery_SeparatorWrinkle_Good,docs\samples\public\product\Battery_SeparatorWrinkle_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count separator wrinkle candidates on a battery separator inspection region.",docs\samples\public\product\Product_Battery_SeparatorWrinkle_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery separator wrinkle benchmark. One shallow wrinkle remains inside the review band.",,Battery_SeparatorWrinkle,Good
Product_Battery_SeparatorWrinkle_Many_Bad,docs\samples\public\product\Battery_SeparatorWrinkle_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery separator with several wrinkle candidates.",docs\samples\public\product\Product_Battery_SeparatorWrinkle_Contour.pipeline.xml,ExpectedFailure,ResultCount,3,6,,,,"Controlled NG benchmark for separator wrinkle count.",,Battery_SeparatorWrinkle,Bad
Product_Battery_SeparatorPinhole_Good,docs\samples\public\product\Battery_SeparatorPinhole_OK.png,572,420,Product Synthetic / Secondary Battery / Blob,"Count separator pinhole candidates under backlight-style inspection.",docs\samples\public\product\Product_Battery_SeparatorPinhole_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery separator pinhole benchmark. One small pinhole candidate remains inside the review band.",,Battery_SeparatorPinhole,Good
Product_Battery_SeparatorPinhole_Many_Bad,docs\samples\public\product\Battery_SeparatorPinhole_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Blob,"Reject a battery separator with several pinhole candidates.",docs\samples\public\product\Product_Battery_SeparatorPinhole_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for separator pinhole count.",,Battery_SeparatorPinhole,Bad
Product_Battery_CoatingGap_Good,docs\samples\public\product\Battery_CoatingGap_OK.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Measure the coating-to-tab clearance gap on a battery electrode.",docs\samples\public\product\Product_Battery_CoatingGap_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.25,,,,"Public-safe secondary-battery coating gap benchmark. The line tool should measure a normal coating clearance band.",,Battery_CoatingGap,Good
Product_Battery_CoatingGap_Narrow_Bad,docs\samples\public\product\Battery_CoatingGap_Narrow_NG.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Reject a coating gap that is too narrow for the same measurement rule.",docs\samples\public\product\Product_Battery_CoatingGap_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for battery coating clearance. The same LineDistance pipeline should fail because the measured gap is below the normal band.",,Battery_CoatingGap,Bad
Product_Battery_ForeignObject_Good,docs\samples\public\product\Battery_ForeignObject_OK.png,572,420,Product Synthetic / Secondary Battery / Blob,"Count bright foreign-object candidates on a battery electrode.",docs\samples\public\product\Product_Battery_ForeignObject_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery foreign-object benchmark. One small candidate remains inside the review band.",,Battery_ForeignObject,Good
Product_Battery_ForeignObject_Many_Bad,docs\samples\public\product\Battery_ForeignObject_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Blob,"Reject a battery electrode with several bright foreign-object candidates.",docs\samples\public\product\Product_Battery_ForeignObject_Blob.pipeline.xml,ExpectedFailure,ResultCount,3,5,,,,"Controlled NG benchmark for battery foreign-object count.",,Battery_ForeignObject,Bad
Product_Battery_EdgeBurr_Good,docs\samples\public\product\Battery_EdgeBurr_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count coating-edge burr candidates on a battery electrode.",docs\samples\public\product\Product_Battery_EdgeBurr_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery edge-burr benchmark. A single small candidate remains inside the review band.",,Battery_EdgeBurr,Good
Product_Battery_EdgeBurr_Many_Bad,docs\samples\public\product\Battery_EdgeBurr_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery electrode with several coating-edge burr candidates.",docs\samples\public\product\Product_Battery_EdgeBurr_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for battery coating-edge burr count.",,Battery_EdgeBurr,Bad
Product_Battery_TabOffset_Good,docs\samples\public\product\Battery_TabOffset_OK.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Measure battery tab offset clearance against a reference lead.",docs\samples\public\product\Product_Battery_TabOffset_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.25,,,,"Public-safe secondary-battery tab offset benchmark. The reference-to-tab clearance stays inside the normal band.",,Battery_TabOffset,Good
Product_Battery_TabOffset_Shifted_Bad,docs\samples\public\product\Battery_TabOffset_Shifted_NG.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Reject a battery tab shifted too close to the reference lead.",docs\samples\public\product\Product_Battery_TabOffset_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for tab offset drift. The same LineDistance pipeline should fail because the clearance is below the normal band.",,Battery_TabOffset,Bad
Product_Battery_SealWidth_Good,docs\samples\public\product\Battery_SealWidth_OK.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Measure battery seal width clearance against a reference band.",docs\samples\public\product\Product_Battery_SealWidth_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe secondary-battery seal width benchmark. The seal band stays inside the normal width window.",,Battery_SealWidth,Good
Product_Battery_SealWidth_Narrow_Bad,docs\samples\public\product\Battery_SealWidth_Narrow_NG.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Reject a battery seal band that is too narrow.",docs\samples\public\product\Product_Battery_SealWidth_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for seal width drift. The same LineDistance pipeline should fail because the width is below the normal band.",,Battery_SealWidth,Bad
Product_Battery_TabWeldVoid_Good,docs\samples\public\product\Battery_TabWeldVoid_OK.png,572,420,Product Synthetic / Secondary Battery / Blob,"Count bright void candidates inside a battery tab weld nugget.",docs\samples\public\product\Product_Battery_TabWeldVoid_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery tab-weld void benchmark. One small void candidate remains inside the review band.",,Battery_TabWeldVoid,Good
Product_Battery_TabWeldVoid_Many_Bad,docs\samples\public\product\Battery_TabWeldVoid_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Blob,"Reject a battery tab weld with too many void candidates.",docs\samples\public\product\Product_Battery_TabWeldVoid_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,8,,,,"Controlled NG benchmark for battery tab-weld void count.",,Battery_TabWeldVoid,Bad
Product_Battery_PouchEdgeFold_Good,docs\samples\public\product\Battery_PouchEdgeFold_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count pouch-edge fold candidates on a battery cell edge.",docs\samples\public\product\Product_Battery_PouchEdgeFold_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery pouch-edge fold benchmark. A single small fold candidate remains inside the review band.",,Battery_PouchEdgeFold,Good
Product_Battery_PouchEdgeFold_Many_Bad,docs\samples\public\product\Battery_PouchEdgeFold_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery pouch edge with several fold candidates.",docs\samples\public\product\Product_Battery_PouchEdgeFold_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for pouch-edge fold count.",,Battery_PouchEdgeFold,Bad
Product_Battery_PouchSealBurn_Good,docs\samples\public\product\Battery_PouchSealBurn_OK.png,572,420,Product Synthetic / Secondary Battery / Blob,"Count pouch seal burn candidates on a battery pouch seal band.",docs\samples\public\product\Product_Battery_PouchSealBurn_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery pouch-seal burn benchmark. One small burn candidate remains inside the review band.",,Battery_PouchSealBurn,Good
Product_Battery_PouchSealBurn_Many_Bad,docs\samples\public\product\Battery_PouchSealBurn_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Blob,"Reject a battery pouch seal with several burn candidates.",docs\samples\public\product\Product_Battery_PouchSealBurn_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for pouch-seal burn count.",,Battery_PouchSealBurn,Bad
Product_Battery_PouchSealBubble_Good,docs\samples\public\product\Battery_PouchSealBubble_OK.png,572,420,Product Synthetic / Secondary Battery / Blob,"Count pouch seal bubble candidates on a battery pouch seal band.",docs\samples\public\product\Product_Battery_PouchSealBubble_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery pouch-seal bubble benchmark. One small bubble candidate remains inside the review band.",,Battery_PouchSealBubble,Good
Product_Battery_PouchSealBubble_Many_Bad,docs\samples\public\product\Battery_PouchSealBubble_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Blob,"Reject a battery pouch seal with several bubble candidates.",docs\samples\public\product\Product_Battery_PouchSealBubble_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for pouch-seal bubble count.",,Battery_PouchSealBubble,Bad
Product_Battery_SealEdgeDelamination_Good,docs\samples\public\product\Battery_SealEdgeDelamination_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count seal-edge delamination candidates on a battery pouch seal band.",docs\samples\public\product\Product_Battery_SealEdgeDelamination_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery seal-edge delamination benchmark. One small edge delamination candidate remains inside the review band.",,Battery_SealEdgeDelamination,Good
Product_Battery_SealEdgeDelamination_Many_Bad,docs\samples\public\product\Battery_SealEdgeDelamination_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery pouch seal with several seal-edge delamination candidates.",docs\samples\public\product\Product_Battery_SealEdgeDelamination_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for seal-edge delamination count.",,Battery_SealEdgeDelamination,Bad
Product_Battery_TabOxidation_Good,docs\samples\public\product\Battery_TabOxidation_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count oxidation candidates on battery tab surfaces.",docs\samples\public\product\Product_Battery_TabOxidation_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery tab-oxidation benchmark. One small oxidation candidate remains inside the review band.",,Battery_TabOxidation,Good
Product_Battery_TabOxidation_Many_Bad,docs\samples\public\product\Battery_TabOxidation_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery tab set with several oxidation candidates.",docs\samples\public\product\Product_Battery_TabOxidation_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for battery tab-oxidation count.",,Battery_TabOxidation,Bad
Product_Battery_TabDiscoloration_Good,docs\samples\public\product\Battery_TabDiscoloration_OK.png,572,420,Product Synthetic / Secondary Battery / Mean,"Measure average brightness of battery tab surfaces for discoloration.",docs\samples\public\product\Product_Battery_TabDiscoloration_Mean.pipeline.xml,Required,MeanValueAvg,145,180,,,,"Public-safe secondary-battery tab-discoloration benchmark. The tab region stays inside the normal brightness band.",,Battery_TabDiscoloration,Good
Product_Battery_TabDiscoloration_Dark_Bad,docs\samples\public\product\Battery_TabDiscoloration_Dark_NG.png,572,420,Product Synthetic / Secondary Battery / Mean,"Reject battery tabs with dark discoloration over the tab region.",docs\samples\public\product\Product_Battery_TabDiscoloration_Mean.pipeline.xml,ExpectedFailure,MeanValueAvg,90,130,,,,"Controlled NG benchmark for tab-discoloration brightness drift.",,Battery_TabDiscoloration,Bad
Product_Battery_SealContamination_Good,docs\samples\public\product\Battery_SealContamination_OK.png,572,420,Product Synthetic / Secondary Battery / Blob,"Count seal-contamination candidates on a battery pouch seal band.",docs\samples\public\product\Product_Battery_SealContamination_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery seal-contamination benchmark. One small candidate remains inside the review band.",,Battery_SealContamination,Good
Product_Battery_SealContamination_Many_Bad,docs\samples\public\product\Battery_SealContamination_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Blob,"Reject a battery pouch seal with several contamination candidates.",docs\samples\public\product\Product_Battery_SealContamination_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for battery seal-contamination count.",,Battery_SealContamination,Bad
Product_Battery_LaserMark_Good,docs\samples\public\product\Battery_LaserMark_OK.png,572,420,Product Synthetic / Secondary Battery / Image Matching,"Find a battery laser mark with image matching.",docs\samples\public\product\Product_Battery_LaserMark_Matching.pipeline.xml,Required,ResultCount;ScoreMax,1;72,1;100,,,,"Public-safe secondary-battery laser-mark benchmark using a generated template crop.",docs\samples\public\product\templates\Battery_LaserMark_Template.png,Battery_LaserMark,Good
Product_Battery_LaserMark_Missing_Bad,docs\samples\public\product\Battery_LaserMark_Missing_NG.png,572,420,Product Synthetic / Secondary Battery / Image Matching,"Reject a missing battery laser mark.",docs\samples\public\product\Product_Battery_LaserMark_Matching.pipeline.xml,ExpectedFailure,ResultCount,0,0,ControlledNoResult,MatchingNoResult,01 Battery Laser Mark Match,"Controlled NG benchmark for laser-mark target presence.",docs\samples\public\product\templates\Battery_LaserMark_Template.png,Battery_LaserMark,Bad
Product_Battery_TabDateCode_Good,docs\samples\public\product\Battery_TabDateCode_OK.png,572,420,Product Synthetic / Secondary Battery / Image Matching,"Find a battery tab date-code mark with image matching.",docs\samples\public\product\Product_Battery_TabDateCode_Matching.pipeline.xml,Required,ResultCount;ScoreMax,1;72,1;100,,,,"Public-safe secondary-battery tab date-code benchmark using a generated template crop.",docs\samples\public\product\templates\Battery_TabDateCode_Template.png,Battery_TabDateCode,Good
Product_Battery_TabDateCode_Wrong_Bad,docs\samples\public\product\Battery_TabDateCode_Wrong_NG.png,572,420,Product Synthetic / Secondary Battery / Image Matching,"Reject a wrong or missing battery tab date-code mark.",docs\samples\public\product\Product_Battery_TabDateCode_Matching.pipeline.xml,ExpectedFailure,ResultCount,0,0,,,,"Controlled NG benchmark for tab date-code target presence.",docs\samples\public\product\templates\Battery_TabDateCode_Template.png,Battery_TabDateCode,Bad
Product_Battery_ElectrolyteFillLine_Good,docs\samples\public\product\Battery_ElectrolyteFillLine_OK.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Measure electrolyte fill-line offset against a reference mark.",docs\samples\public\product\Product_Battery_ElectrolyteFillLine_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe secondary-battery electrolyte fill-line benchmark. The fill line stays inside the normal offset window.",,Battery_ElectrolyteFillLine,Good
Product_Battery_ElectrolyteFillLine_Low_Bad,docs\samples\public\product\Battery_ElectrolyteFillLine_Low_NG.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Reject an electrolyte fill line shifted too close to the reference.",docs\samples\public\product\Product_Battery_ElectrolyteFillLine_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for low electrolyte fill-line offset.",,Battery_ElectrolyteFillLine,Bad
Product_Battery_CellVentAlignment_Good,docs\samples\public\product\Battery_CellVentAlignment_OK.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Measure battery cell vent alignment against a reference mark.",docs\samples\public\product\Product_Battery_CellVentAlignment_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe secondary-battery cell vent alignment benchmark. The vent remains inside the normal spacing window.",,Battery_CellVentAlignment,Good
Product_Battery_CellVentAlignment_Shifted_Bad,docs\samples\public\product\Battery_CellVentAlignment_Shifted_NG.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Reject a cell vent shifted too close to the reference mark.",docs\samples\public\product\Product_Battery_CellVentAlignment_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for shifted cell vent alignment.",,Battery_CellVentAlignment,Bad
Product_Battery_PouchTabSkew_Good,docs\samples\public\product\Battery_PouchTabSkew_OK.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Measure pouch tab skew clearance against a reference tab mark.",docs\samples\public\product\Product_Battery_PouchTabSkew_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe secondary-battery pouch tab skew benchmark. The tab clearance remains inside the normal spacing window.",,Battery_PouchTabSkew,Good
Product_Battery_PouchTabSkew_Shifted_Bad,docs\samples\public\product\Battery_PouchTabSkew_Shifted_NG.png,572,420,Product Synthetic / Secondary Battery / LineDistance,"Reject a pouch tab skewed too close to the reference mark.",docs\samples\public\product\Product_Battery_PouchTabSkew_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for shifted pouch tab skew.",,Battery_PouchTabSkew,Bad
Product_Battery_CurrentCollectorBurr_Good,docs\samples\public\product\Battery_CurrentCollectorBurr_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count current-collector burr candidates along a battery foil edge.",docs\samples\public\product\Product_Battery_CurrentCollectorBurr_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery current collector burr benchmark. One small burr candidate remains inside the acceptable count.",,Battery_CurrentCollectorBurr,Good
Product_Battery_CurrentCollectorBurr_Many_Bad,docs\samples\public\product\Battery_CurrentCollectorBurr_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery current collector with several burr candidates.",docs\samples\public\product\Product_Battery_CurrentCollectorBurr_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for current collector burr count.",,Battery_CurrentCollectorBurr,Bad
Product_Battery_SeparatorEdgeTear_Good,docs\samples\public\product\Battery_SeparatorEdgeTear_OK.png,572,420,Product Synthetic / Secondary Battery / Contour,"Count separator edge-tear candidates along a battery separator edge.",docs\samples\public\product\Product_Battery_SeparatorEdgeTear_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe secondary-battery separator edge-tear benchmark. One small tear candidate remains inside the acceptable count.",,Battery_SeparatorEdgeTear,Good
Product_Battery_SeparatorEdgeTear_Many_Bad,docs\samples\public\product\Battery_SeparatorEdgeTear_Many_NG.png,572,420,Product Synthetic / Secondary Battery / Contour,"Reject a battery separator edge with several tear candidates.",docs\samples\public\product\Product_Battery_SeparatorEdgeTear_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for separator edge-tear count.",,Battery_SeparatorEdgeTear,Bad
Product_Display_PixelDefect_Good,docs\samples\public\product\Display_PixelDefect_OK.png,572,420,Product Synthetic / Display / Contour,"Count isolated bright pixel-defect candidates on a display panel.",docs\samples\public\product\Product_Display_PixelDefect_Contour.pipeline.xml,Required,ResultCount,0,3,,,,"Public-safe display defect benchmark. A small number of isolated candidates is acceptable.",,Display_PixelDefect,Good
Product_Display_PixelDefect_Many_Bad,docs\samples\public\product\Display_PixelDefect_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display panel with too many bright defect candidates.",docs\samples\public\product\Product_Display_PixelDefect_Contour.pipeline.xml,ExpectedFailure,ResultCount,6,9,,,,"Controlled NG benchmark for display pixel-defect count.",,Display_PixelDefect,Bad
Product_Display_Alignment_Good,docs\samples\public\product\Display_Alignment_OK.png,572,420,Product Synthetic / Display / Image Matching,"Find a display alignment cross mark with image matching.",docs\samples\public\product\Product_Display_Alignment_Matching.pipeline.xml,Required,ResultCount;ScoreMax,1;75,1;100,,,,"Public-safe display alignment benchmark using a generated template crop.",docs\samples\public\product\templates\Display_Alignment_Template.png,Display_Alignment,Good
Product_Display_Alignment_Wrong_Bad,docs\samples\public\product\Display_Alignment_Wrong_NG.png,572,420,Product Synthetic / Display / Image Matching,"Reject a wrong display alignment mark.",docs\samples\public\product\Product_Display_Alignment_Matching.pipeline.xml,ExpectedFailure,ResultCount,0,0,ControlledNoResult,MatchingNoResult,01 Display Alignment Mark Match,"Controlled NG benchmark for image matching target presence.",docs\samples\public\product\templates\Display_Alignment_Template.png,Display_Alignment,Bad
Product_Display_Scratch_Good,docs\samples\public\product\Display_Scratch_OK.png,572,420,Product Synthetic / Display / Contour,"Count bright scratch candidates on a display panel.",docs\samples\public\product\Product_Display_Scratch_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display scratch benchmark. A single short scratch candidate remains inside the review band.",,Display_Scratch,Good
Product_Display_Scratch_Many_Bad,docs\samples\public\product\Display_Scratch_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display panel with several scratch-like bright defects.",docs\samples\public\product\Product_Display_Scratch_Contour.pipeline.xml,ExpectedFailure,ResultCount,3,6,,,,"Controlled NG benchmark for display scratch count. The same Contour pipeline should fail because too many scratch candidates are present.",,Display_Scratch,Bad
Product_Display_BrightnessBand_Good,docs\samples\public\product\Display_BrightnessBand_OK.png,572,420,Product Synthetic / Display / Mean,"Measure the average brightness of a display mura-band inspection region.",docs\samples\public\product\Product_Display_BrightnessBand_Mean.pipeline.xml,Required,MeanValueAvg,70,95,,,,"Public-safe display brightness-band benchmark. The band stays inside the normal brightness range.",,Display_BrightnessBand,Good
Product_Display_BrightnessBand_Bright_Bad,docs\samples\public\product\Display_BrightnessBand_Bright_NG.png,572,420,Product Synthetic / Display / Mean,"Reject a display panel with a bright mura band.",docs\samples\public\product\Product_Display_BrightnessBand_Mean.pipeline.xml,ExpectedFailure,MeanValueAvg,110,155,,,,"Controlled NG benchmark for display brightness-band drift.",,Display_BrightnessBand,Bad
Product_Display_Particle_Good,docs\samples\public\product\Display_Particle_OK.png,572,420,Product Synthetic / Display / Blob,"Count bright particle candidates on a display panel.",docs\samples\public\product\Product_Display_Particle_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display particle benchmark. A single small particle remains inside the review band.",,Display_Particle,Good
Product_Display_Particle_Many_Bad,docs\samples\public\product\Display_Particle_Many_NG.png,572,420,Product Synthetic / Display / Blob,"Reject a display panel with too many bright particle candidates.",docs\samples\public\product\Product_Display_Particle_Blob.pipeline.xml,ExpectedFailure,ResultCount,5,8,,,,"Controlled NG benchmark for display particle count.",,Display_Particle,Bad
Product_Display_MuraVariation_Good,docs\samples\public\product\Display_MuraVariation_OK.png,572,420,Product Synthetic / Display / Mean,"Measure display mura variation under controlled uneven illumination.",docs\samples\public\product\Product_Display_MuraVariation_Mean.pipeline.xml,Required,MeanValueAvg,78,96,,,,"Public-safe display mura variation benchmark. The inspection band remains inside the normal brightness window.",,Display_MuraVariation,Good
Product_Display_MuraVariation_Uneven_Bad,docs\samples\public\product\Display_MuraVariation_Uneven_NG.png,572,420,Product Synthetic / Display / Mean,"Reject a display panel with an uneven bright mura variation band.",docs\samples\public\product\Product_Display_MuraVariation_Mean.pipeline.xml,ExpectedFailure,MeanValueAvg,115,145,,,,"Controlled NG benchmark for uneven display mura brightness drift.",,Display_MuraVariation,Bad
Product_Display_EdgeChip_Good,docs\samples\public\product\Display_EdgeChip_OK.png,572,420,Product Synthetic / Display / Contour,"Count bright edge-chip candidates on a display panel edge.",docs\samples\public\product\Product_Display_EdgeChip_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display edge-chip benchmark. A single small edge chip remains inside the review band.",,Display_EdgeChip,Good
Product_Display_EdgeChip_Many_Bad,docs\samples\public\product\Display_EdgeChip_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display panel edge with too many chip candidates.",docs\samples\public\product\Product_Display_EdgeChip_Contour.pipeline.xml,ExpectedFailure,ResultCount,3,6,,,,"Controlled NG benchmark for display edge-chip count.",,Display_EdgeChip,Bad
Product_Display_BezelChip_Good,docs\samples\public\product\Display_BezelChip_OK.png,572,420,Product Synthetic / Display / Contour,"Count bright bezel-chip candidates on a display bezel edge.",docs\samples\public\product\Product_Display_BezelChip_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display bezel-chip benchmark. One small chip remains inside the review band.",,Display_BezelChip,Good
Product_Display_BezelChip_Many_Bad,docs\samples\public\product\Display_BezelChip_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display bezel with several chip candidates.",docs\samples\public\product\Product_Display_BezelChip_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display bezel-chip count.",,Display_BezelChip,Bad
Product_Display_CornerCrack_Good,docs\samples\public\product\Display_CornerCrack_OK.png,572,420,Product Synthetic / Display / Contour,"Count bright corner-crack candidates on a display panel corner.",docs\samples\public\product\Product_Display_CornerCrack_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display corner-crack benchmark. One small corner line remains inside the review band.",,Display_CornerCrack,Good
Product_Display_CornerCrack_Many_Bad,docs\samples\public\product\Display_CornerCrack_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display panel corner with several crack candidates.",docs\samples\public\product\Product_Display_CornerCrack_Contour.pipeline.xml,ExpectedFailure,ResultCount,3,6,,,,"Controlled NG benchmark for display corner-crack count.",,Display_CornerCrack,Bad
Product_Display_CornerLightLeak_Good,docs\samples\public\product\Display_CornerLightLeak_OK.png,572,420,Product Synthetic / Display / Mean,"Measure corner light-leak brightness drift on a display corner region.",docs\samples\public\product\Product_Display_CornerLightLeak_Mean.pipeline.xml,Required,MeanValueAvg,75,98,,,,"Public-safe display corner light-leak benchmark. The corner region stays inside the normal mean-brightness band.",,Display_CornerLightLeak,Good
Product_Display_CornerLightLeak_Bright_Bad,docs\samples\public\product\Display_CornerLightLeak_Bright_NG.png,572,420,Product Synthetic / Display / Mean,"Reject a display panel with a bright corner light leak.",docs\samples\public\product\Product_Display_CornerLightLeak_Mean.pipeline.xml,ExpectedFailure,MeanValueAvg,110,160,,,,"Controlled NG benchmark for corner light-leak brightness drift.",,Display_CornerLightLeak,Bad
Product_Display_BlackMatrixScratch_Good,docs\samples\public\product\Display_BlackMatrixScratch_OK.png,572,420,Product Synthetic / Display / Contour,"Count black-matrix scratch candidates on a display subpixel region.",docs\samples\public\product\Product_Display_BlackMatrixScratch_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display black-matrix scratch benchmark. One short scratch candidate remains inside the review band.",,Display_BlackMatrixScratch,Good
Product_Display_BlackMatrixScratch_Many_Bad,docs\samples\public\product\Display_BlackMatrixScratch_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display black-matrix area with several scratch candidates.",docs\samples\public\product\Product_Display_BlackMatrixScratch_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display black-matrix scratch count.",,Display_BlackMatrixScratch,Bad
Product_Display_LineDropout_Good,docs\samples\public\product\Display_LineDropout_OK.png,572,420,Product Synthetic / Display / Contour,"Count line-dropout gap candidates on a display signal-line region.",docs\samples\public\product\Product_Display_LineDropout_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display line-dropout benchmark. One short dropout gap remains inside the review band.",,Display_LineDropout,Good
Product_Display_LineDropout_Many_Bad,docs\samples\public\product\Display_LineDropout_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display signal-line region with several dropout gaps.",docs\samples\public\product\Product_Display_LineDropout_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display line-dropout count.",,Display_LineDropout,Bad
Product_Display_MuraSpotCluster_Good,docs\samples\public\product\Display_MuraSpotCluster_OK.png,572,420,Product Synthetic / Display / Contour,"Count bright mura spot candidates on a display inspection region.",docs\samples\public\product\Product_Display_MuraSpotCluster_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display mura-spot-cluster benchmark. One small spot remains inside the review band.",,Display_MuraSpotCluster,Good
Product_Display_MuraSpotCluster_Many_Bad,docs\samples\public\product\Display_MuraSpotCluster_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display inspection region with several mura spot candidates.",docs\samples\public\product\Product_Display_MuraSpotCluster_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display mura spot count.",,Display_MuraSpotCluster,Bad
Product_Display_MuraRing_Good,docs\samples\public\product\Display_MuraRing_OK.png,572,420,Product Synthetic / Display / Contour,"Count bright mura ring candidates on a display inspection region.",docs\samples\public\product\Product_Display_MuraRing_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display mura-ring benchmark. One small ring remains inside the review band.",,Display_MuraRing,Good
Product_Display_MuraRing_Many_Bad,docs\samples\public\product\Display_MuraRing_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display inspection region with several mura ring candidates.",docs\samples\public\product\Product_Display_MuraRing_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display mura ring count.",,Display_MuraRing,Bad
Product_Display_PolarizerScratch_Good,docs\samples\public\product\Display_PolarizerScratch_OK.png,572,420,Product Synthetic / Display / Contour,"Count polarizer scratch candidates on a display inspection film.",docs\samples\public\product\Product_Display_PolarizerScratch_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display polarizer-scratch benchmark. One short scratch remains inside the review band.",,Display_PolarizerScratch,Good
Product_Display_PolarizerScratch_Many_Bad,docs\samples\public\product\Display_PolarizerScratch_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display polarizer film with several scratch candidates.",docs\samples\public\product\Product_Display_PolarizerScratch_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display polarizer-scratch count.",,Display_PolarizerScratch,Bad
Product_Display_PolarizerCrease_Good,docs\samples\public\product\Display_PolarizerCrease_OK.png,572,420,Product Synthetic / Display / Contour,"Count polarizer crease candidates on a display inspection film.",docs\samples\public\product\Product_Display_PolarizerCrease_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display polarizer-crease benchmark. One crease remains inside the review band.",,Display_PolarizerCrease,Good
Product_Display_PolarizerCrease_Many_Bad,docs\samples\public\product\Display_PolarizerCrease_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display polarizer film with several crease candidates.",docs\samples\public\product\Product_Display_PolarizerCrease_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display polarizer-crease count.",,Display_PolarizerCrease,Bad
Product_Display_SealWidth_Good,docs\samples\public\product\Display_SealWidth_OK.png,572,420,Product Synthetic / Display / LineDistance,"Measure display seal width clearance against a reference band.",docs\samples\public\product\Product_Display_SealWidth_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe display seal-width benchmark. The seal band stays inside the normal width window.",,Display_SealWidth,Good
Product_Display_SealWidth_Narrow_Bad,docs\samples\public\product\Display_SealWidth_Narrow_NG.png,572,420,Product Synthetic / Display / LineDistance,"Reject a display seal band that is too narrow.",docs\samples\public\product\Product_Display_SealWidth_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for display seal-width drift.",,Display_SealWidth,Bad
Product_Display_AlignmentOffset_Good,docs\samples\public\product\Display_AlignmentOffset_OK.png,572,420,Product Synthetic / Display / LineDistance,"Measure display alignment mark offset against a reference bar.",docs\samples\public\product\Product_Display_AlignmentOffset_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe display alignment-offset benchmark. The reference-to-mark distance stays inside the normal band.",,Display_AlignmentOffset,Good
Product_Display_AlignmentOffset_Shifted_Bad,docs\samples\public\product\Display_AlignmentOffset_Shifted_NG.png,572,420,Product Synthetic / Display / LineDistance,"Reject a display alignment mark shifted too close to the reference bar.",docs\samples\public\product\Product_Display_AlignmentOffset_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for display alignment offset drift.",,Display_AlignmentOffset,Bad
Product_Display_ColorFilterShift_Good,docs\samples\public\product\Display_ColorFilterShift_OK.png,572,420,Product Synthetic / Display / LineDistance,"Measure color-filter registration shift against a reference bar.",docs\samples\public\product\Product_Display_ColorFilterShift_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe display color-filter registration benchmark. The reference-to-filter distance stays inside the normal band.",,Display_ColorFilterShift,Good
Product_Display_ColorFilterShift_Shifted_Bad,docs\samples\public\product\Display_ColorFilterShift_Shifted_NG.png,572,420,Product Synthetic / Display / LineDistance,"Reject a color-filter bar shifted too close to the reference.",docs\samples\public\product\Product_Display_ColorFilterShift_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for display color-filter shift. The same LineDistance pipeline should fail because the measured shift is below the normal band.",,Display_ColorFilterShift,Bad
Product_Display_LineStain_Good,docs\samples\public\product\Display_LineStain_OK.png,572,420,Product Synthetic / Display / Contour,"Count bright line-stain candidates on a display panel.",docs\samples\public\product\Product_Display_LineStain_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display line-stain benchmark. One short stain candidate remains inside the review band.",,Display_LineStain,Good
Product_Display_LineStain_Many_Bad,docs\samples\public\product\Display_LineStain_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display panel with several bright line-stain candidates.",docs\samples\public\product\Product_Display_LineStain_Contour.pipeline.xml,ExpectedFailure,ResultCount,3,6,,,,"Controlled NG benchmark for display line-stain count.",,Display_LineStain,Bad
Product_Display_SubpixelBridge_Good,docs\samples\public\product\Display_SubpixelBridge_OK.png,572,420,Product Synthetic / Display / Blob,"Count subpixel bridge candidates inside a display subpixel grid.",docs\samples\public\product\Product_Display_SubpixelBridge_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display subpixel-bridge benchmark. One small bridge candidate remains inside the review band.",,Display_SubpixelBridge,Good
Product_Display_SubpixelBridge_Many_Bad,docs\samples\public\product\Display_SubpixelBridge_Many_NG.png,572,420,Product Synthetic / Display / Blob,"Reject a display subpixel grid with several bridge candidates.",docs\samples\public\product\Product_Display_SubpixelBridge_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display subpixel-bridge count.",,Display_SubpixelBridge,Bad
Product_Display_PadBridge_Good,docs\samples\public\product\Display_PadBridge_OK.png,572,420,Product Synthetic / Display / Blob,"Count pad bridge candidates inside a display pad inspection region.",docs\samples\public\product\Product_Display_PadBridge_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display pad-bridge benchmark. One small bridge candidate remains inside the review band.",,Display_PadBridge,Good
Product_Display_PadBridge_Many_Bad,docs\samples\public\product\Display_PadBridge_Many_NG.png,572,420,Product Synthetic / Display / Blob,"Reject a display pad row with several bridge candidates.",docs\samples\public\product\Product_Display_PadBridge_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display pad-bridge count.",,Display_PadBridge,Bad
Product_Display_PolarizerBubble_Good,docs\samples\public\product\Display_PolarizerBubble_OK.png,572,420,Product Synthetic / Display / Blob,"Count polarizer bubble candidates on a display panel inspection region.",docs\samples\public\product\Product_Display_PolarizerBubble_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display polarizer bubble benchmark. One small bubble candidate remains inside the review band.",,Display_PolarizerBubble,Good
Product_Display_PolarizerBubble_Many_Bad,docs\samples\public\product\Display_PolarizerBubble_Many_NG.png,572,420,Product Synthetic / Display / Blob,"Reject a display panel with several polarizer bubble candidates.",docs\samples\public\product\Product_Display_PolarizerBubble_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display polarizer bubble count.",,Display_PolarizerBubble,Bad
Product_Display_SealContamination_Good,docs\samples\public\product\Display_SealContamination_OK.png,572,420,Product Synthetic / Display / Blob,"Count seal-contamination candidates on a display seal band.",docs\samples\public\product\Product_Display_SealContamination_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display seal-contamination benchmark. One small contamination candidate remains inside the review band.",,Display_SealContamination,Good
Product_Display_SealContamination_Many_Bad,docs\samples\public\product\Display_SealContamination_Many_NG.png,572,420,Product Synthetic / Display / Blob,"Reject a display seal band with several contamination candidates.",docs\samples\public\product\Product_Display_SealContamination_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display seal-contamination count.",,Display_SealContamination,Bad
Product_Display_SealCornerContamination_Good,docs\samples\public\product\Display_SealCornerContamination_OK.png,572,420,Product Synthetic / Display / Blob,"Count contamination candidates concentrated near a display seal corner.",docs\samples\public\product\Product_Display_SealCornerContamination_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display seal-corner contamination benchmark. One small corner candidate remains inside the acceptable count.",,Display_SealCornerContamination,Good
Product_Display_SealCornerContamination_Many_Bad,docs\samples\public\product\Display_SealCornerContamination_Many_NG.png,572,420,Product Synthetic / Display / Blob,"Reject a display seal corner with several contamination candidates.",docs\samples\public\product\Product_Display_SealCornerContamination_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for clustered contamination near the display seal corner.",,Display_SealCornerContamination,Bad
Product_Display_PolarizerEdgeLift_Good,docs\samples\public\product\Display_PolarizerEdgeLift_OK.png,572,420,Product Synthetic / Display / Contour,"Count lifted polarizer edge candidates along a display edge.",docs\samples\public\product\Product_Display_PolarizerEdgeLift_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display polarizer edge-lift benchmark. One small lifted edge candidate remains inside the acceptable count.",,Display_PolarizerEdgeLift,Good
Product_Display_PolarizerEdgeLift_Many_Bad,docs\samples\public\product\Display_PolarizerEdgeLift_Many_NG.png,572,420,Product Synthetic / Display / Contour,"Reject a display polarizer edge with several lifted-edge candidates.",docs\samples\public\product\Product_Display_PolarizerEdgeLift_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for polarizer edge-lift candidate count.",,Display_PolarizerEdgeLift,Bad
Product_Display_CofBondParticle_Good,docs\samples\public\product\Display_CofBondParticle_OK.png,572,420,Product Synthetic / Display / Blob,"Count COF bond particle candidates near a display bond pad row.",docs\samples\public\product\Product_Display_CofBondParticle_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe display COF bond particle benchmark. One small particle candidate remains inside the acceptable count.",,Display_CofBondParticle,Good
Product_Display_CofBondParticle_Many_Bad,docs\samples\public\product\Display_CofBondParticle_Many_NG.png,572,420,Product Synthetic / Display / Blob,"Reject a display COF bond row with several particle candidates.",docs\samples\public\product\Product_Display_CofBondParticle_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for display COF bond particle count.",,Display_CofBondParticle,Bad
Product_Display_FpcAlignmentMark_Good,docs\samples\public\product\Display_FpcAlignmentMark_OK.png,572,420,Product Synthetic / Display / Image Matching,"Find a display FPC alignment mark with image matching.",docs\samples\public\product\Product_Display_FpcAlignmentMark_Matching.pipeline.xml,Required,ResultCount;ScoreMax,1;72,1;100,,,,"Public-safe display FPC alignment-mark benchmark using a generated template crop.",docs\samples\public\product\templates\Display_FpcAlignmentMark_Template.png,Display_FpcAlignmentMark,Good
Product_Display_FpcAlignmentMark_Wrong_Bad,docs\samples\public\product\Display_FpcAlignmentMark_Wrong_NG.png,572,420,Product Synthetic / Display / Image Matching,"Reject a wrong display FPC alignment mark.",docs\samples\public\product\Product_Display_FpcAlignmentMark_Matching.pipeline.xml,ExpectedFailure,ResultCount,0,0,,,,"Controlled NG benchmark for FPC alignment-mark target presence.",docs\samples\public\product\templates\Display_FpcAlignmentMark_Template.png,Display_FpcAlignmentMark,Bad
Product_Semiconductor_Fiducial_Good,docs\samples\public\product\Semiconductor_Fiducial_OK.png,572,420,Product Synthetic / Semiconductor / EdgeBasedMatching,"Find a semiconductor fiducial by edge geometry.",docs\samples\public\product\Product_Semiconductor_Fiducial_Edge.pipeline.xml,Required,ScoreMax;ResultCount,70;1,100;1,,,,"Public-safe semiconductor edge-based matching benchmark.",docs\samples\public\product\templates\Semiconductor_Fiducial_Template.png,Semiconductor_Fiducial,Good
Product_Semiconductor_Fiducial_Wrong_Bad,docs\samples\public\product\Semiconductor_Fiducial_Wrong_NG.png,572,420,Product Synthetic / Semiconductor / EdgeBasedMatching,"Reject a wrong semiconductor fiducial shape.",docs\samples\public\product\Product_Semiconductor_Fiducial_Edge.pipeline.xml,ExpectedFailure,ResultCount,0,0,,,,"Controlled NG benchmark for edge-based matching target presence.",docs\samples\public\product\templates\Semiconductor_Fiducial_Template.png,Semiconductor_Fiducial,Bad
Product_Semiconductor_BondMark_Good,docs\samples\public\product\Semiconductor_BondMark_OK.png,572,420,Product Synthetic / Semiconductor / FeatureMatching,"Find a feature-rich semiconductor bond mark.",docs\samples\public\product\Product_Semiconductor_BondMark_Feature.pipeline.xml,Required,ScoreMax;ResultCount,80;1,100;3,,,,"Public-safe semiconductor feature matching benchmark using a generated feature-rich mark.",docs\samples\public\product\templates\Semiconductor_BondMark_Template.png,Semiconductor_BondMark,Good
Product_Semiconductor_BondMark_Wrong_Bad,docs\samples\public\product\Semiconductor_BondMark_Wrong_NG.png,572,420,Product Synthetic / Semiconductor / FeatureMatching,"Reject a wrong semiconductor bond mark.",docs\samples\public\product\Product_Semiconductor_BondMark_Feature.pipeline.xml,ExpectedFailure,ScoreMax,20,70,,,,"Controlled NG benchmark for feature matching score discrimination.",docs\samples\public\product\templates\Semiconductor_BondMark_Template.png,Semiconductor_BondMark,Bad
Product_Semiconductor_PadContamination_Good,docs\samples\public\product\Semiconductor_PadContamination_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count bright contamination candidates on semiconductor pad contacts.",docs\samples\public\product\Product_Semiconductor_PadContamination_Blob.pipeline.xml,Required,ResultCount,0,2,,,,"Public-safe semiconductor pad contamination benchmark. One small bright candidate remains acceptable.",,Semiconductor_PadContamination,Good
Product_Semiconductor_PadContamination_Heavy_Bad,docs\samples\public\product\Semiconductor_PadContamination_Heavy_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject a semiconductor pad row with too many contamination candidates.",docs\samples\public\product\Product_Semiconductor_PadContamination_Blob.pipeline.xml,ExpectedFailure,ResultCount,5,8,,,,"Controlled NG benchmark for semiconductor pad contamination count.",,Semiconductor_PadContamination,Bad
Product_Semiconductor_DieContamination_Good,docs\samples\public\product\Semiconductor_DieContamination_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count bright contamination candidates on a semiconductor die surface.",docs\samples\public\product\Product_Semiconductor_DieContamination_Blob.pipeline.xml,Required,ResultCount,0,2,,,,"Public-safe semiconductor die contamination benchmark. One small bright candidate remains acceptable.",,Semiconductor_DieContamination,Good
Product_Semiconductor_DieContamination_Heavy_Bad,docs\samples\public\product\Semiconductor_DieContamination_Heavy_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject a semiconductor die with too many contamination candidates.",docs\samples\public\product\Product_Semiconductor_DieContamination_Blob.pipeline.xml,ExpectedFailure,ResultCount,5,8,,,,"Controlled NG benchmark for semiconductor die contamination count.",,Semiconductor_DieContamination,Bad
Product_Semiconductor_UnderfillVoid_Good,docs\samples\public\product\Semiconductor_UnderfillVoid_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count underfill void candidates inside a semiconductor package region.",docs\samples\public\product\Product_Semiconductor_UnderfillVoid_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor underfill void benchmark. One small void candidate remains inside the review band.",,Semiconductor_UnderfillVoid,Good
Product_Semiconductor_UnderfillVoid_Many_Bad,docs\samples\public\product\Semiconductor_UnderfillVoid_Many_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject a semiconductor underfill region with several void candidates.",docs\samples\public\product\Product_Semiconductor_UnderfillVoid_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor underfill void count.",,Semiconductor_UnderfillVoid,Bad
Product_Semiconductor_PackageVoid_Good,docs\samples\public\product\Semiconductor_PackageVoid_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count package void candidates inside a semiconductor molded package.",docs\samples\public\product\Product_Semiconductor_PackageVoid_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor package void benchmark. One small void candidate remains inside the review band.",,Semiconductor_PackageVoid,Good
Product_Semiconductor_PackageVoid_Many_Bad,docs\samples\public\product\Semiconductor_PackageVoid_Many_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject a semiconductor package with several void candidates.",docs\samples\public\product\Product_Semiconductor_PackageVoid_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor package void candidate count.",,Semiconductor_PackageVoid,Bad
Product_Semiconductor_SolderBridge_Good,docs\samples\public\product\Semiconductor_SolderBridge_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count bright solder-bridge candidates between semiconductor pads.",docs\samples\public\product\Product_Semiconductor_SolderBridge_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor solder-bridge benchmark. One small bridge candidate remains inside the review band.",,Semiconductor_SolderBridge,Good
Product_Semiconductor_SolderBridge_Many_Bad,docs\samples\public\product\Semiconductor_SolderBridge_Many_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject a semiconductor pad row with several solder-bridge candidates.",docs\samples\public\product\Product_Semiconductor_SolderBridge_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor solder-bridge count.",,Semiconductor_SolderBridge,Bad
Product_Semiconductor_PadScratch_Good,docs\samples\public\product\Semiconductor_PadScratch_OK.png,572,420,Product Synthetic / Semiconductor / Contour,"Count bright scratch candidates across semiconductor pads.",docs\samples\public\product\Product_Semiconductor_PadScratch_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor pad-scratch benchmark. One short scratch candidate remains inside the review band.",,Semiconductor_PadScratch,Good
Product_Semiconductor_PadScratch_Many_Bad,docs\samples\public\product\Semiconductor_PadScratch_Many_NG.png,572,420,Product Synthetic / Semiconductor / Contour,"Reject a semiconductor pad row with several scratch candidates.",docs\samples\public\product\Product_Semiconductor_PadScratch_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor pad-scratch count.",,Semiconductor_PadScratch,Bad
Product_Semiconductor_BondPadNick_Good,docs\samples\public\product\Semiconductor_BondPadNick_OK.png,572,420,Product Synthetic / Semiconductor / Contour,"Count bright bond-pad nick candidates on a semiconductor pad row.",docs\samples\public\product\Product_Semiconductor_BondPadNick_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor bond-pad nick benchmark. One small nick remains inside the review band.",,Semiconductor_BondPadNick,Good
Product_Semiconductor_BondPadNick_Many_Bad,docs\samples\public\product\Semiconductor_BondPadNick_Many_NG.png,572,420,Product Synthetic / Semiconductor / Contour,"Reject a semiconductor pad row with several bond-pad nick candidates.",docs\samples\public\product\Product_Semiconductor_BondPadNick_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor bond-pad nick count.",,Semiconductor_BondPadNick,Bad
Product_Semiconductor_WireBondLift_Good,docs\samples\public\product\Semiconductor_WireBondLift_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count wire-bond lift candidates near semiconductor bond pads.",docs\samples\public\product\Product_Semiconductor_WireBondLift_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor wire-bond lift benchmark. One small lift candidate remains inside the review band.",,Semiconductor_WireBondLift,Good
Product_Semiconductor_WireBondLift_Many_Bad,docs\samples\public\product\Semiconductor_WireBondLift_Many_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject a semiconductor pad row with several wire-bond lift candidates.",docs\samples\public\product\Product_Semiconductor_WireBondLift_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor wire-bond lift count.",,Semiconductor_WireBondLift,Bad
Product_Semiconductor_WireSweepAlignment_Good,docs\samples\public\product\Semiconductor_WireSweepAlignment_OK.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Measure wire sweep alignment clearance against a reference bond wire.",docs\samples\public\product\Product_Semiconductor_WireSweepAlignment_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe semiconductor wire sweep alignment benchmark. The wire clearance stays inside the normal band.",,Semiconductor_WireSweepAlignment,Good
Product_Semiconductor_WireSweepAlignment_Shifted_Bad,docs\samples\public\product\Semiconductor_WireSweepAlignment_Shifted_NG.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Reject a swept semiconductor wire shifted too close to the reference bond wire.",docs\samples\public\product\Product_Semiconductor_WireSweepAlignment_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for shifted semiconductor wire sweep alignment.",,Semiconductor_WireSweepAlignment,Bad
Product_Semiconductor_BondPadCorrosion_Good,docs\samples\public\product\Semiconductor_BondPadCorrosion_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count bond-pad corrosion candidates on a semiconductor pad row.",docs\samples\public\product\Product_Semiconductor_BondPadCorrosion_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor bond-pad corrosion benchmark. One small corrosion candidate remains inside the acceptable count.",,Semiconductor_BondPadCorrosion,Good
Product_Semiconductor_BondPadCorrosion_Many_Bad,docs\samples\public\product\Semiconductor_BondPadCorrosion_Many_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject semiconductor bond pads with several corrosion candidates.",docs\samples\public\product\Product_Semiconductor_BondPadCorrosion_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor bond-pad corrosion count.",,Semiconductor_BondPadCorrosion,Bad
Product_Semiconductor_PadPitch_Good,docs\samples\public\product\Semiconductor_PadPitch_OK.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Measure the clearance pitch between two semiconductor pad edges.",docs\samples\public\product\Product_Semiconductor_PadPitch_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.25,,,,"Public-safe semiconductor pad pitch benchmark. The distance tool should measure a normal pad pitch band.",,Semiconductor_PadPitch,Good
Product_Semiconductor_PadPitch_Narrow_Bad,docs\samples\public\product\Semiconductor_PadPitch_Narrow_NG.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Reject a semiconductor pad pitch that is too narrow.",docs\samples\public\product\Product_Semiconductor_PadPitch_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for semiconductor pad pitch spacing.",,Semiconductor_PadPitch,Bad
Product_Semiconductor_RotationMark_Good,docs\samples\public\product\Semiconductor_RotationMark_OK.png,572,420,Product Synthetic / Semiconductor / EdgeBasedMatching,"Find a semiconductor rotation mark and verify it is near zero degrees.",docs\samples\public\product\Product_Semiconductor_RotationMark_Edge.pipeline.xml,Required,ScoreMax;AngleAvg;ResultCount,60;-5;1,100;5;1,,,,"Public-safe semiconductor rotation-tolerance benchmark. The edge template should match near zero degrees.",docs\samples\public\product\templates\Semiconductor_RotationMark_Template.png,Semiconductor_RotationMark,Good
Product_Semiconductor_RotationMark_Rotated_Bad,docs\samples\public\product\Semiconductor_RotationMark_Rotated_NG.png,572,420,Product Synthetic / Semiconductor / EdgeBasedMatching,"Reject a semiconductor rotation mark that is outside the angle tolerance.",docs\samples\public\product\Product_Semiconductor_RotationMark_Edge.pipeline.xml,ExpectedFailure,AngleAvg;ResultCount,-22;1,-10;1,,,,"Controlled NG benchmark for semiconductor rotation tolerance. The same edge-matching pipeline should find the mark but fail the angle gate.",docs\samples\public\product\templates\Semiconductor_RotationMark_Template.png,Semiconductor_RotationMark,Bad
Product_Semiconductor_LeadAlignment_Good,docs\samples\public\product\Semiconductor_LeadAlignment_OK.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Measure semiconductor lead alignment clearance against a reference lead.",docs\samples\public\product\Product_Semiconductor_LeadAlignment_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.25,,,,"Public-safe semiconductor lead alignment benchmark. The lead clearance stays inside the normal band.",,Semiconductor_LeadAlignment,Good
Product_Semiconductor_LeadAlignment_Shifted_Bad,docs\samples\public\product\Semiconductor_LeadAlignment_Shifted_NG.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Reject a semiconductor lead shifted too close to the reference lead.",docs\samples\public\product\Product_Semiconductor_LeadAlignment_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for lead alignment drift. The same LineDistance pipeline should fail because the clearance is below the normal band.",,Semiconductor_LeadAlignment,Bad
Product_Semiconductor_LeadWidth_Good,docs\samples\public\product\Semiconductor_LeadWidth_OK.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Measure semiconductor lead width on a package lead frame.",docs\samples\public\product\Product_Semiconductor_LeadWidth_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.26,,,,"Public-safe semiconductor lead-width benchmark. The selected lead width stays inside the normal band.",,Semiconductor_LeadWidth,Good
Product_Semiconductor_LeadWidth_Narrow_Bad,docs\samples\public\product\Semiconductor_LeadWidth_Narrow_NG.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Reject a semiconductor lead that is too narrow.",docs\samples\public\product\Product_Semiconductor_LeadWidth_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for narrow semiconductor lead width.",,Semiconductor_LeadWidth,Bad
Product_Semiconductor_LeadCoplanarity_Good,docs\samples\public\product\Semiconductor_LeadCoplanarity_OK.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Measure lead-foot coplanarity clearance against a reference lead.",docs\samples\public\product\Product_Semiconductor_LeadCoplanarity_Distance.pipeline.xml,Required,DistanceMmAvg,0.20,0.25,,,,"Public-safe semiconductor lead-coplanarity benchmark. The lead-foot clearance stays inside the normal band.",,Semiconductor_LeadCoplanarity,Good
Product_Semiconductor_LeadCoplanarity_Shifted_Bad,docs\samples\public\product\Semiconductor_LeadCoplanarity_Shifted_NG.png,572,420,Product Synthetic / Semiconductor / LineDistance,"Reject a lead-foot coplanarity drift that is too close to the reference lead.",docs\samples\public\product\Product_Semiconductor_LeadCoplanarity_Distance.pipeline.xml,ExpectedFailure,DistanceMmAvg,0.09,0.14,,,,"Controlled NG benchmark for semiconductor lead-coplanarity drift.",,Semiconductor_LeadCoplanarity,Bad
Product_Semiconductor_ProbeMark_Good,docs\samples\public\product\Semiconductor_ProbeMark_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count probe-mark candidates on semiconductor pad contacts.",docs\samples\public\product\Product_Semiconductor_ProbeMark_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor probe-mark benchmark. One small probe mark remains inside the review band.",,Semiconductor_ProbeMark,Good
Product_Semiconductor_ProbeMark_Many_Bad,docs\samples\public\product\Semiconductor_ProbeMark_Many_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject a semiconductor pad row with several probe-mark candidates.",docs\samples\public\product\Product_Semiconductor_ProbeMark_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor probe-mark count.",,Semiconductor_ProbeMark,Bad
Product_Semiconductor_DieEdgeChip_Good,docs\samples\public\product\Semiconductor_DieEdgeChip_OK.png,572,420,Product Synthetic / Semiconductor / Contour,"Count die-edge chip candidates on a semiconductor die edge.",docs\samples\public\product\Product_Semiconductor_DieEdgeChip_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor die-edge chip benchmark. One small edge chip remains inside the review band.",,Semiconductor_DieEdgeChip,Good
Product_Semiconductor_DieEdgeChip_Many_Bad,docs\samples\public\product\Semiconductor_DieEdgeChip_Many_NG.png,572,420,Product Synthetic / Semiconductor / Contour,"Reject a semiconductor die edge with several chip candidates.",docs\samples\public\product\Product_Semiconductor_DieEdgeChip_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor die-edge chip count.",,Semiconductor_DieEdgeChip,Bad
Product_Semiconductor_MoldingFlash_Good,docs\samples\public\product\Semiconductor_MoldingFlash_OK.png,572,420,Product Synthetic / Semiconductor / Contour,"Count molding-flash candidates on a semiconductor package edge.",docs\samples\public\product\Product_Semiconductor_MoldingFlash_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor molding-flash benchmark. One small flash candidate remains inside the review band.",,Semiconductor_MoldingFlash,Good
Product_Semiconductor_MoldingFlash_Many_Bad,docs\samples\public\product\Semiconductor_MoldingFlash_Many_NG.png,572,420,Product Synthetic / Semiconductor / Contour,"Reject a semiconductor package edge with several molding-flash candidates.",docs\samples\public\product\Product_Semiconductor_MoldingFlash_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor molding-flash count.",,Semiconductor_MoldingFlash,Bad
Product_Semiconductor_PackageCrack_Good,docs\samples\public\product\Semiconductor_PackageCrack_OK.png,572,420,Product Synthetic / Semiconductor / Contour,"Count package-crack candidates on a semiconductor package surface.",docs\samples\public\product\Product_Semiconductor_PackageCrack_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor package-crack benchmark. One small crack remains inside the review band.",,Semiconductor_PackageCrack,Good
Product_Semiconductor_PackageCrack_Many_Bad,docs\samples\public\product\Semiconductor_PackageCrack_Many_NG.png,572,420,Product Synthetic / Semiconductor / Contour,"Reject a semiconductor package surface with several crack candidates.",docs\samples\public\product\Product_Semiconductor_PackageCrack_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor package-crack count.",,Semiconductor_PackageCrack,Bad
Product_Semiconductor_PackageCornerChip_Good,docs\samples\public\product\Semiconductor_PackageCornerChip_OK.png,572,420,Product Synthetic / Semiconductor / Contour,"Count package corner-chip candidates on a semiconductor package body.",docs\samples\public\product\Product_Semiconductor_PackageCornerChip_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor package corner-chip benchmark. One small corner chip remains inside the review band.",,Semiconductor_PackageCornerChip,Good
Product_Semiconductor_PackageCornerChip_Many_Bad,docs\samples\public\product\Semiconductor_PackageCornerChip_Many_NG.png,572,420,Product Synthetic / Semiconductor / Contour,"Reject a semiconductor package body with several corner-chip candidates.",docs\samples\public\product\Product_Semiconductor_PackageCornerChip_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor package corner-chip count.",,Semiconductor_PackageCornerChip,Bad
Product_Semiconductor_LeadBurr_Good,docs\samples\public\product\Semiconductor_LeadBurr_OK.png,572,420,Product Synthetic / Semiconductor / Contour,"Count lead-burr candidates on semiconductor lead tips.",docs\samples\public\product\Product_Semiconductor_LeadBurr_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor lead-burr benchmark. One small burr remains inside the review band.",,Semiconductor_LeadBurr,Good
Product_Semiconductor_LeadBurr_Many_Bad,docs\samples\public\product\Semiconductor_LeadBurr_Many_NG.png,572,420,Product Synthetic / Semiconductor / Contour,"Reject semiconductor leads with several burr candidates.",docs\samples\public\product\Product_Semiconductor_LeadBurr_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor lead-burr count.",,Semiconductor_LeadBurr,Bad
Product_Semiconductor_LeadCrack_Good,docs\samples\public\product\Semiconductor_LeadCrack_OK.png,572,420,Product Synthetic / Semiconductor / Contour,"Count lead-crack candidates on semiconductor lead tips.",docs\samples\public\product\Product_Semiconductor_LeadCrack_Contour.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor lead-crack benchmark. One small crack remains inside the review band.",,Semiconductor_LeadCrack,Good
Product_Semiconductor_LeadCrack_Many_Bad,docs\samples\public\product\Semiconductor_LeadCrack_Many_NG.png,572,420,Product Synthetic / Semiconductor / Contour,"Reject semiconductor leads with several crack candidates.",docs\samples\public\product\Product_Semiconductor_LeadCrack_Contour.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor lead-crack count.",,Semiconductor_LeadCrack,Bad
Product_Semiconductor_LeadOxidation_Good,docs\samples\public\product\Semiconductor_LeadOxidation_OK.png,572,420,Product Synthetic / Semiconductor / Blob,"Count lead-oxidation candidates on semiconductor lead tips.",docs\samples\public\product\Product_Semiconductor_LeadOxidation_Blob.pipeline.xml,Required,ResultCount,0,1,,,,"Public-safe semiconductor lead-oxidation benchmark. One small oxidation mark remains inside the review band.",,Semiconductor_LeadOxidation,Good
Product_Semiconductor_LeadOxidation_Many_Bad,docs\samples\public\product\Semiconductor_LeadOxidation_Many_NG.png,572,420,Product Synthetic / Semiconductor / Blob,"Reject semiconductor leads with several oxidation candidates.",docs\samples\public\product\Product_Semiconductor_LeadOxidation_Blob.pipeline.xml,ExpectedFailure,ResultCount,4,7,,,,"Controlled NG benchmark for semiconductor lead-oxidation count.",,Semiconductor_LeadOxidation,Bad
Product_Semiconductor_PackagePolarity_Good,docs\samples\public\product\Semiconductor_PackagePolarity_OK.png,572,420,Product Synthetic / Semiconductor / Image Matching,"Find a semiconductor package polarity mark with image matching.",docs\samples\public\product\Product_Semiconductor_PackagePolarity_Matching.pipeline.xml,Required,ResultCount;ScoreMax,1;72,1;100,,,,"Public-safe semiconductor package polarity benchmark using a generated template crop.",docs\samples\public\product\templates\Semiconductor_PackagePolarity_Template.png,Semiconductor_PackagePolarity,Good
Product_Semiconductor_PackagePolarity_Missing_Bad,docs\samples\public\product\Semiconductor_PackagePolarity_Missing_NG.png,572,420,Product Synthetic / Semiconductor / Image Matching,"Reject a semiconductor package with no polarity mark.",docs\samples\public\product\Product_Semiconductor_PackagePolarity_Matching.pipeline.xml,ExpectedFailure,ResultCount,0,0,,,,"Controlled NG benchmark for package polarity target presence.",docs\samples\public\product\templates\Semiconductor_PackagePolarity_Template.png,Semiconductor_PackagePolarity,Bad
Product_Semiconductor_PackageLaserText_Good,docs\samples\public\product\Semiconductor_PackageLaserText_OK.png,572,420,Product Synthetic / Semiconductor / Image Matching,"Find a semiconductor package laser text mark with image matching.",docs\samples\public\product\Product_Semiconductor_PackageLaserText_Matching.pipeline.xml,Required,ResultCount;ScoreMax,1;72,1;100,,,,"Public-safe semiconductor package laser-text benchmark using a generated template crop.",docs\samples\public\product\templates\Semiconductor_PackageLaserText_Template.png,Semiconductor_PackageLaserText,Good
Product_Semiconductor_PackageLaserText_Missing_Bad,docs\samples\public\product\Semiconductor_PackageLaserText_Missing_NG.png,572,420,Product Synthetic / Semiconductor / Image Matching,"Reject a semiconductor package with missing laser text.",docs\samples\public\product\Product_Semiconductor_PackageLaserText_Matching.pipeline.xml,ExpectedFailure,ResultCount,0,0,,,,"Controlled NG benchmark for package laser-text target presence.",docs\samples\public\product\templates\Semiconductor_PackageLaserText_Template.png,Semiconductor_PackageLaserText,Bad
Product_Semiconductor_WaferDieMark_Good,docs\samples\public\product\Semiconductor_WaferDieMark_OK.png,572,420,Product Synthetic / Semiconductor / Image Matching,"Find a semiconductor wafer die mark with image matching.",docs\samples\public\product\Product_Semiconductor_WaferDieMark_Matching.pipeline.xml,Required,ResultCount;ScoreMax,1;72,1;100,,,,"Public-safe semiconductor wafer die mark benchmark using a generated template crop.",docs\samples\public\product\templates\Semiconductor_WaferDieMark_Template.png,Semiconductor_WaferDieMark,Good
Product_Semiconductor_WaferDieMark_Wrong_Bad,docs\samples\public\product\Semiconductor_WaferDieMark_Wrong_NG.png,572,420,Product Synthetic / Semiconductor / Image Matching,"Reject a wrong semiconductor wafer die mark.",docs\samples\public\product\Product_Semiconductor_WaferDieMark_Matching.pipeline.xml,ExpectedFailure,ResultCount,0,0,,,,"Controlled NG benchmark for wafer die mark target presence.",docs\samples\public\product\templates\Semiconductor_WaferDieMark_Template.png,Semiconductor_WaferDieMark,Bad
Product_Field_FilmStripe_SurfaceReview,docs\samples\public\product\field\Field_FilmStripe_SurfaceReview.png,960,540,Product Field / Surface / Contour,"Explore stripe and web-edge contrast for threshold and contour setup.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,3,8,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_TexturedRoller_SurfaceReview,docs\samples\public\product\field\Field_TexturedRoller_SurfaceReview.png,960,720,Product Field / Surface / Contour,"Explore roller texture and edge contrast for dark-feature contour setup.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,1,4,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_AluminumExtrusion_ProfileSection,docs\samples\public\product\field\Field_AluminumExtrusion_ProfileSection.png,768,960,Product Field / Profile / Contour,"Explore extruded profile boundaries and internal wall contours.",docs\samples\public\product\Product_Field_BrightFeature_Contour.pipeline.xml,Explore,ResultCount,15,40,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_PcbCorner_PadContamination,docs\samples\public\product\field\Field_PcbCorner_PadContamination.png,960,720,Product Field / PCB / Contour,"Explore PCB pad contamination and bright conductor contour setup.",docs\samples\public\product\Product_Field_BrightFeature_Contour.pipeline.xml,Explore,ResultCount,70,130,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_CoatedWeb_SurfaceStain,docs\samples\public\product\field\Field_CoatedWeb_SurfaceStain.png,960,540,Product Field / Surface / Mean,"Explore coated web brightness drift and stain review.",docs\samples\public\product\Product_Field_SurfaceMean.pipeline.xml,Explore,MeanValueAvg,130,165,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_MachinedShaft_SurfacePitting,docs\samples\public\product\field\Field_MachinedShaft_SurfacePitting.png,960,720,Product Field / Metal / Contour,"Reject a shaft surface with 18 retained dark-pit candidates after Filter -> Threshold -> Morphology -> ROI Contour processing.",docs\samples\public\product\Product_Field_ShaftPitting_Inspection.pipeline.xml,ExpectedFailure,ResultCount,18,18,,,,"Project-authored field-style NG sample; the source-rendered result preserves 18 small dark-pit candidates inside the reviewed ROI. The recipe rejects any nonzero count; catalog 18..18 verifies this exact NG fixture without claiming field recall.",,Shaft_SurfacePitting,Bad
Product_Field_ProfileExtrusion_CrossSection,docs\samples\public\product\field\Field_ProfileExtrusion_CrossSection.png,768,960,Product Field / Profile / Contour,"Explore hollow profile section boundaries and wall geometry.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,8,24,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_PcbPad_Contamination,docs\samples\public\product\field\Field_PcbPad_Contamination.png,960,720,Product Field / PCB / Contour,"Explore PCB pad contamination and solder-pad contour setup.",docs\samples\public\product\Product_Field_BrightFeature_Contour.pipeline.xml,Explore,ResultCount,10,35,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_KeypadPanel_ButtonReview,docs\samples\public\product\field\Field_KeypadPanel_ButtonReview.png,960,720,Product Field / Keypad / Contour,"Explore keypad button shape and mark contrast review.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,20,45,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_ConnectorTerminal_Array,docs\samples\public\product\field\Field_ConnectorTerminal_Array.png,960,720,Product Field / Connector / Contour,"Explore connector terminal array spacing and form contours.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,1,5,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_KeypadOverlay_BacklightReview,docs\samples\public\product\field\Field_KeypadOverlay_BacklightReview.png,960,720,Product Field / Keypad / Contour,"Explore translucent keypad overlay shapes under bright background.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,15,40,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_ControllerPanel_ButtonInspection,docs\samples\public\product\field\Field_ControllerPanel_ButtonInspection.png,960,720,Product Field / Panel / Contour,"Explore controller panel button grouping and printed mark contrast.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,25,55,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_TerminalStrip_FormInspection,docs\samples\public\product\field\Field_TerminalStrip_FormInspection.png,960,540,Product Field / Connector / Contour,"Explore terminal strip form variation and missing/bent terminal review.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,3,8,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_PinHeader_ArrayInspection,docs\samples\public\product\field\Field_PinHeader_ArrayInspection.png,960,540,Product Field / Connector / Contour,"Explore pin-header array spacing and repeated terminal contours.",docs\samples\public\product\Product_Field_DarkFeature_Contour.pipeline.xml,Explore,ResultCount,1,6,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_PcbAssembly_PadPattern,docs\samples\public\product\field\Field_PcbAssembly_PadPattern.png,960,720,Product Field / PCB / Contour,"Explore PCB assembly pad pattern and component footprint contours.",docs\samples\public\product\Product_Field_BrightFeature_Contour.pipeline.xml,Explore,ResultCount,130,220,,,,"Project-authored field-style sample normalized for public product sample review."
Product_Field_PerforatedPlate_HoleArray,docs\samples\public\product\field\Field_PerforatedPlate_HoleArray.png,960,720,Product Field / Hole Array / Blob + Contour,"Compare Filter -> Threshold -> Morphology with Blob and Contour branches on the same cleaned layer.",docs\samples\public\product\Product_Field_PerforatedPlate_Inspection.pipeline.xml,Required,ResultCount,34,34,,,,"Project-authored field-style sample; both detection branches retain 34 holes and exclude the full-image background contour."